Cr2Si2Te6 is a ferromagnetic semiconductor 2D material having a Curie temperature of ~33K. The layers are stacked together via van der Waals interactions and can be exfoliated into thin 2D layers.
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The Cr2Si2Te6 crystals produced at HQ Graphene have a typical lateral size of ~0.1-0.3 cm, hexagonal shaped and have a metallic appearance. More information about the Cr2Si2Te6 crystals we sell can be found below.
|Crystal size||~3 mm|
|Electrical properties||Ferromagnetic semiconductor (Curie temperature ~33K)|
|Unit cell parameters||a = b = 0.675 nm, c = 2.063 nm, α = β = 90°, γ = 120°|
|Monolayer properties||Link to C2DB containing calculated properties|
|Characterized by||XRD, EDX|
|More information?||Please contact us by email or phone|
The single crystal Cr2Si2Te6 is characterized using:XRD: single crystal and powder X-ray diffraction (D8 Venture Bruker and D8 Advance Bruker)
EDX: Energy-dispersive X-ray spectroscopy for stoichiometric analysis
XRD and EDX on Cr2Si2Te6:
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