ZrSe3 (Zirconium Triselenide)

ZrSe3 Zirconium Triselenide ZrSe3 is a semiconductor having an indirect bandgap of ~1.1 eV and is diamagnetic. The layers are stacked together via van der Waals interactions and can be exfoliated into thin 2D layers. Zirconim Triselenide belongs to the group-IV transition metal trichalcogenides.

The ZrSe3 crystals produced at HQ Graphene have a typical shape a flat needle with a lateral size of ~0.6-0.8 cm and ~1mm width, having a metallic appearance.


ZrSe3 crystal properties, Diamagnetic
Crystal size ~8 mm
Electrical properties Semiconductor
Crystal structure Monoclinic P
Unit cell parameters a = 0.541 nm, b = 0.375 nm, c = 0.944 nm, α = γ = 90°, γ = 97.50°
Type Synthetic
Purity >99.995 %
Characterized by XRD, Raman, EDX
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The single crystal ZrSe3 is characterized using:

XRD: single crystal and powder X-ray diffraction (D8 Venture Bruker and D8 Advance Bruker)
EDX: Energy-dispersive X-ray spectroscopy for stoichiometric analysis
Raman: 785 nm Raman system

Raman, XRD and EDX on ZrSe3:

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X-ray diffraction on a ZrSe3 single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 5 XRD peaks correspond, from left to right, to (00l) with l = 2, 3, 4, 5, 6, 7, 8

Powder X-ray diffraction (XRD) of a single crystal ZrSe3. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.

Raman spectrum of a single crystal ZrSe3. Measurement was performed with a 785 nm Raman system at room temperature.





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ZrSe3 (Zirconium Triselenide)


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