ZrTe3 (Zirconium Tritelluride)

ZrTe3 Zirconium Tritelluride ZrTe3 is a semimetal, partially gapped charge density waves (CDW) below ~63K and a superconductor (Tc ~2K) . The layers are stacked together via van der Waals interactions and can be exfoliated into thin 2D layers. Zirconium Tritelluride belongs to the group-IV transition metal trichalcogenides.

The ZrTe3 crystals produced at HQ Graphene have a typical shape a flat needle with a lateral size of ~0.6-0.8 cm and XX width, having a metallic appearance.


ZrTe3 crystal properties
Crystal size ~8 mm
Electrical properties Semimetal, Charge density waves system (CDW, ~63K), Superconductor (Tc ~2K)
Crystal structure Monoclinic P
Unit cell parameters a = 0.5864 nm, b = 0.3918 nm, c = 1.009 nm, α = γ = 90°, γ = 98.00°
Type Synthetic
Purity >99.995 %
Characterized by XRD, Raman, EDX
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The single crystal ZrTe3 is characterized using:

XRD: single crystal and powder X-ray diffraction (D8 Venture Bruker and D8 Advance Bruker)
EDX: Energy-dispersive X-ray spectroscopy for stoichiometric analysis
Raman: 785 nm Raman system

Raman, XRD and EDX on ZrTe3:

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X-ray diffraction on a ZrTe3 single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 5 XRD peaks correspond, from left to right, to (00l) with l = 2, 3, 4, 5, 6, 7, 8

Powder X-ray diffraction (XRD) of a single crystal ZrTe3. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.

Stoichiometric analysis of a single crystal ZrTe3 by Energy-dispersive X-ray spectroscopy (EDX).

Raman spectrum of a single crystal ZrTe3. Measurement was performed with a 785 nm Raman system at room temperature.





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ZrTe3 (Zirconium Tritelluride)


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